The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 16, 2015

Filed:

May. 11, 2010
Applicants:

Richard R. Schediwy, Union City, CA (US);

Robert J. Bolender, San Jose, CA (US);

Adam Schwartz, Redwood City, CA (US);

Fritz Norby, Felton, CA (US);

Shawn P. Day, San Jose, CA (US);

Inventors:

Richard R. Schediwy, Union City, CA (US);

Robert J. Bolender, San Jose, CA (US);

Adam Schwartz, Redwood City, CA (US);

Fritz Norby, Felton, CA (US);

Shawn P. Day, San Jose, CA (US);

Assignee:

Synaptics Incorporated, San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/044 (2006.01); G06F 3/045 (2006.01); G01L 1/14 (2006.01); G06F 3/041 (2006.01); H03K 17/98 (2006.01);
U.S. Cl.
CPC ...
G01L 1/146 (2013.01); G06F 3/0414 (2013.01); G06F 2203/04106 (2013.01); G06F 2203/04104 (2013.01); G06F 3/044 (2013.01); H03K 17/98 (2013.01);
Abstract

Devices and methods are provided that utilize a first electrode disposed on a first substrate and a second electrode disposed on a second substrate, where the first electrode and the second electrode define at least part of a variable capacitance. A third substrate is arranged between the first substrate and the second substrate, the third substrate having an opening arranged such that at least a portion of the first electrode and the second electrode overlap the opening. A transmission element is provided that partially overlaps the opening. The transmission element is physically coupled to the second electrode such that a force biasing the transmission element causes the second electrode to deflect relative to the first electrode, thus changing the variable capacitance. A measurement of the variable capacitance may then be used to determine force information.


Find Patent Forward Citations

Loading…