The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 16, 2015
Filed:
Oct. 22, 2012
Shin-etsu Chemical Co., Ltd., Tokyo, JP;
Hiroshi Oyamada, Gunma, JP;
Shin-Etsu Chemical Co., Ltd., Tokyo, JP;
Abstract
An optical fiber curvature measuring method comprising rotatably holding an end of the optical fiber, irradiating two points at a prescribed distance from each other on a side surface of the fiber with a pair of parallel light beams orthogonal to an axial direction, measuring representative positions of scattered and reflected light beams scattered by the side surface as coordinate positions on an axis parallel to the optical fiber axis, calculating a difference between the two coordinate positions, rotating the fiber by a prescribed angle, repeating the calculation of the difference a plurality of times, calculating a positive representative value for amplitude Sfrom the difference obtained at each angle, calculating curvature from the amplitude Sas a first curvature of a first optical fiber longitudinal position, changing positions of the beams irradiating the fiber in the longitudinal direction, and calculating first to m-th curvatures by repeating this process.