The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 16, 2015
Filed:
Apr. 29, 2011
Joseph John Manak, Albany, NY (US);
Bernhard Erich Hermann Claus, Niskayuna, NY (US);
Jens Rittscher, Ballston Lake, NY (US);
Hao Lai, Niskayuna, NY (US);
Jeffrey Wayne Eberhard, Albany, NY (US);
Kedar Bhalchandra Khare, Niskayuna, NY (US);
Cyril Riddell, Issy-les-Moulineaux, FR;
Yves Lucien Trousset, Palaiseau, FR;
Joseph John Manak, Albany, NY (US);
Bernhard Erich Hermann Claus, Niskayuna, NY (US);
Jens Rittscher, Ballston Lake, NY (US);
Hao Lai, Niskayuna, NY (US);
Jeffrey Wayne Eberhard, Albany, NY (US);
Kedar Bhalchandra Khare, Niskayuna, NY (US);
Cyril Riddell, Issy-les-Moulineaux, FR;
Yves Lucien Trousset, Palaiseau, FR;
GENERAL ELECTRIC COMPANY, Schenectady, NY (US);
Abstract
The subject matter disclosed herein relates to X-ray imaging systems, and more specifically to digital X-ray imaging systems. In one embodiment, an imaging system includes an X-ray source configured to emit X-rays. The imaging system also includes an X-ray detector configured to detect the emitted X-rays and produce a corresponding electrical signal. The imaging system also includes a gantry configured to at least partially revolve the X-ray source and the X-ray detector about a primary rotational axis. The X-ray detector is coupled to the gantry so that a diagonal of the X-ray detector is oriented substantially perpendicular to the primary rotational axis.