The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 09, 2015

Filed:

Sep. 04, 2012
Applicants:

NG Pei Sin, Singapore, SG;

James A. Sinclair, Cleveland Heights, OH (US);

Taryl Jasper, South Euclid, OH (US);

Inventors:

Ng Pei Sin, Singapore, SG;

James A. Sinclair, Cleveland Heights, OH (US);

Taryl Jasper, South Euclid, OH (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 9/00 (2006.01); H04L 9/08 (2006.01); H04L 9/32 (2006.01);
U.S. Cl.
CPC ...
H04L 9/0891 (2013.01); H04L 9/3271 (2013.01);
Abstract

Aspects of the present invention provide machines, systems, and methods in which industrial control systems may be secured from compromise and/or disruption via authentication and firewall. In particular, an industrial controller may: randomly generate an exchange key and send the exchange key to a client device in response to a transaction request originating from the client device; combine the exchange key with a locally stored pass key to produce an authentication code; and compare a challenge key received from the client device to the authentication code to determine a match between the challenge key and the authentication code. A successful match between the challenge key and the authentication code may allow the client device to further access the industrial controller using a common industrial protocol (CIP), and a failed match between the challenge key and the authentication code may prevent the client device from further access to the industrial controller.


Find Patent Forward Citations

Loading…