The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 09, 2015
Filed:
Feb. 27, 2013
International Business Machines Corporation, Armonk, NY (US);
Alan F. Benner, Poughkeepsie, NY (US);
Richard B. Finch, New Paltz, NY (US);
Jason Thomas Hirst, Poughkeepsie, NY (US);
Peter Paul Lai, Rochester, MN (US);
Gerald Glen Stanquist, Salt Point, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method for testing an optical network is disclosed. The method includes transmitting a first optical power level on a first optical port of an optical assembly, where the optical assembly includes the first optical port, an optical cable and/or an optical waveguide, and a second optical port. The optical assembly is installed in an assembled computer and the assembled computer is in a state suitable for an end user. The method includes measuring a second optical power level at the second optical port and determining a quality level by determining if the second optical power level is below a quality threshold value. The transmitting, the measuring, and the determining occur within the assembled computer. An apparatus and computer program product also perform the functions of the method.