The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 09, 2015

Filed:

Mar. 26, 2013
Applicant:

Sony Corporation, Tokyo, JP;

Inventors:

Takaaki Matsui, Fukushima, JP;

Aya Mashiko, Fukushima, JP;

Tadashi Matsushita, Fukushima, JP;

Takehiko Ishii, Fukushima, JP;

Assignee:

SONY CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01M 2/00 (2006.01); H01M 4/02 (2006.01); H01M 4/133 (2010.01); H01M 4/64 (2006.01); H01M 4/70 (2006.01); H01M 10/44 (2006.01);
U.S. Cl.
CPC ...
H01M 4/133 (2013.01); H01M 4/64 (2013.01); Y02E 60/122 (2013.01); H01M 4/70 (2013.01); H01M 10/44 (2013.01); H01M 2004/021 (2013.01); H01M 2004/027 (2013.01); H01M 2220/30 (2013.01);
Abstract

A battery includes a positive electrode, a negative electrode where a negative electrode active material layer containing a negative electrode active material containing natural graphite is formed on at least one surface of a negative electrode collector, and an electrolyte. A thickness of the negative electrode active material layer per one surface of the negative electrode collector is 50 μm or more and 100 μm or less, and in the negative electrode active material layer from the negative electrode collector up to ½ of the thickness of the layer in a surface direction of the negative electrode active material layer, an orientation degree A expressed as (peak intensity of carbon 002 face/peak intensity of carbon 110 face) that is a peak intensity ratio of a carbon 002 face and a carbon 110 face measured by an X-ray diffraction is 100 or more and 500 or less.


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