The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 09, 2015

Filed:

Dec. 13, 2006
Applicants:

Stephen A. Lammert, Glenburn, ME (US);

Samuel E. Tolley, Springville, UT (US);

Jeffrey L. Jones, Orem, UT (US);

Randall W. Waite, Springville, UT (US);

Edgar D. Lee, Highland, UT (US);

Milton L. Lee, Pleasant Grove, UT (US);

Inventors:

Stephen A. Lammert, Glenburn, ME (US);

Samuel E. Tolley, Springville, UT (US);

Jeffrey L. Jones, Orem, UT (US);

Randall W. Waite, Springville, UT (US);

Edgar D. Lee, Highland, UT (US);

Milton L. Lee, Pleasant Grove, UT (US);

Assignee:

BRIGHAM YOUNG UNIVERSITY, Provo, UT (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 49/36 (2006.01); H01J 49/04 (2006.01); H01J 49/42 (2006.01); H01J 49/00 (2006.01); B01D 59/44 (2006.01);
U.S. Cl.
CPC ...
H01J 49/424 (2013.01); H01J 49/422 (2013.01); H01J 49/423 (2013.01); H01J 49/4225 (2013.01); B01D 59/44 (2013.01); H01J 49/0013 (2013.01);
Abstract

A scaled down version of a toroidal radio frequency (RF) ion trap mass analyzer operating with RF trapping voltages on the order of 1 kVyet despite the reduced dimensions, retains roughly the same ion trapping volume as conventional 3D quadrupole ion traps, wherein the curved geometry enables construction of a compact mass analyzer and easy interface with conventional electron multipliers.


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