The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 09, 2015

Filed:

Jan. 18, 2013
Applicant:

Omron Corporation, Kyoto, JP;

Inventors:

Kiyoaki Tanaka, Kizugawa, JP;

Takayoshi Yamashita, Kizugawa, JP;

Assignee:

OMRON CORPORATION, Kyoto-shi, JP;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/46 (2006.01); G06K 9/62 (2006.01); G06K 9/78 (2006.01);
U.S. Cl.
CPC ...
G06K 9/78 (2013.01); G06K 9/6257 (2013.01);
Abstract

An image processor is provided, the image processor including a general-purpose classifier that detects a predetermined large classification target; and a dedicated classifier that detects a small classification target which is a subdivision of the large classification target; an image acquisition part that acquires an image photographed by a camera; an image extracting part that extracts a registered image including a user-assigned domain from the photographed image; a dedicated classifier performing part that causes the dedicated classifier to perform detection processing to the registered image extracted; a dedicated classifier selector that selects the dedicated classifier having a highest index indicating superiority or inferiority of a detection result; and a classifier generator that generates a registered image classifier to detect a target included in the registered image by replacing some weak classifiers included in the selected dedicated classifier with weak classifiers included in the general-purpose classifier.


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