The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 09, 2015
Filed:
Apr. 12, 2011
Fan Wang, Stanford, CA (US);
Xinyu Xu, Vancouver, WA (US);
Chang Yuan, Vancouver, WA (US);
Petrus J. L. Van Beek, Camas, WA (US);
Fan Wang, Stanford, CA (US);
Xinyu Xu, Vancouver, WA (US);
Chang Yuan, Vancouver, WA (US);
Petrus J. L. van Beek, Camas, WA (US);
Sharp Laboratories of America, Inc., Camas, WA (US);
Abstract
A method for classification of samples comprising providing a trained statistical model based upon a set of initial samples. Receiving a set of first samples and training a first statistical model base upon the first set of samples, where the first statistical model is of the same class as the trained statistical model. Receiving a set of second samples and training a second statistical model base upon the second set of samples, where the second statistical model is of the same class as the trained statistical model. The trained statistical model, the first statistical model, and the second statistical model, being independent of each other and collectively used to classify another sample.