The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 09, 2015
Filed:
Jan. 13, 2012
Yunyun Cao, Tokyo, JP;
Hirofumi Nishimura, Kanagawa, JP;
Sugiri Pranata, Singapore, SG;
Zhiheng Niu, Singapore, SG;
Yunyun Cao, Tokyo, JP;
Hirofumi Nishimura, Kanagawa, JP;
Sugiri Pranata, Singapore, SG;
Zhiheng Niu, Singapore, SG;
Abstract
Provided is a feature extraction device whereby it is possible, while using local binary patterns, to extract image features with which object detection which is robust against disparities in a photographic environment is possible. A feature extraction unit () comprises: a binary pattern generation unit () which generates, for each of all pixels or partial pixels in an image, local binary patterns which denote, by bit values, whether the difference in pixel values between the pixel and the surrounding adjacent pixels is greater than or equal to a threshold value; a weighting generation unit () which determines, for each generated local binary pattern, a weighting according to the pixel value difference; and a histogram generation unit () which applies the determined weightings to the corresponding local binary patterns and generates a histogram which denotes the distribution of the local binary patterns which are generated from the image.