The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 09, 2015
Filed:
Nov. 12, 2012
Hiroyuki Kawamoto, Kanagawa, JP;
Hiroyuki Kawamoto, Kanagawa, JP;
RICOH COMPANY, LTD., Tokyo, JP;
Abstract
An image inspection method and apparatus for inspecting images output on sheets including a reference white plate disposed at a position of the transport route of sheet while facing a scan position for scanning a sheet; a contact glass disposed opposite the reference white plate; an image scanning device fixed facing the scan position to conduct a scanning operation through the contact glass, a noise detector to detect a first noise image in a blank area of the inspection sheet by scanning the blank area of the inspection sheet, and a second noise image in the reference white plate by scanning the reference white plate; and a stain source determination unit to determine a noise origin from the contact glass or the reference white plate.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile