The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 09, 2015
Filed:
Apr. 18, 2011
Maxwell O. Drukman, San Francisco, CA (US);
Andreas W. Wendker, Mountain View, CA (US);
Stephen R. Lewallen, San Jose, CA (US);
David V. Payne, Los Altos, CA (US);
Maxwell O. Drukman, San Francisco, CA (US);
Andreas W. Wendker, Mountain View, CA (US);
Stephen R. Lewallen, San Jose, CA (US);
David V. Payne, Los Altos, CA (US);
Apple Inc., Cupertino, CA (US);
Abstract
A tool for analyzing software is enhanced to provide multiple views of a stack trace, with each view having a different level of detail. Different views may be lightly simplified, moderately simplified, or heavily simplified. The display of a complete stack trace includes entries for all stack frames in the stack trace. The display of a simplified stack trace includes entries for fewer than all stack frames in the stack trace, thereby 'hiding' or 'collapsing' entries for some of the stack frames, relative to the complete stack trace display. After a user specifies a level of complexity with which to show a stack trace, the enhanced analysis tool GUI updates the stack trace display according to the specified level. A complexity level is associated with a set of heuristics that is used to create a view of a stack trace at that complexity level.