The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 09, 2015
Filed:
Mar. 08, 2013
Applicant:
International Business Machines Corporation, Armonk, NY (US);
Inventors:
Yea J. Chu, Chicago, IL (US);
Sier Han, Xi'an, CN;
Jing-Yun Shyr, Naperville, IL (US);
Damir Spisic, Chicago, IL (US);
Xueying Zhang, Xi'an, CN;
Assignee:
International Business Machines Corporation, Armonk, NY (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30598 (2013.01); G06F 17/30592 (2013.01);
Abstract
A subset of (k−1)-dimensional tables are received, wherein k is greater than 1. A set of k-dimensional tables is created by combining each of the (k−1)-dimensional tables with a non-included dimension corresponding to a 1-dimensional table. Significance of interaction and interaction effect size is computed for the created set of k-dimensional tables to determine dimension and measure interactions.