The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 09, 2015
Filed:
Dec. 07, 2012
Reuters America Inc., New York, NY (US);
Timothy P. Edwards, Woodridge, IL (US);
Rajasekhar R. Gunturu, Aurora, IL (US);
Brian D. Sandri, Bolingbrook, IL (US);
John Patrick Merrick, Aurora, IL (US);
Reuters America Inc., New York, NY (US);
Abstract
A method and system for measuring latency is provided. A monitor node is used to measure latency in a computer network or in a computing device by time stamping signal messages sent from nodes in the computer network and/or tasks in a particular node or device. The time stamps are generated using a system clock of the monitor node to reduce any discrepancies in timing. In addition, the monitor node may compensate for latencies between the monitor node and each of the one or more nodes or devices across which latency is to be measured. Signal messages may include a data message ID and/or a node ID identifying the message that is being tracked and for which latency is being measured. Latency may further be measured across multiple tasks being performed in the same or different nodes or devices by transmitting signal messages for each of the multiple tasks.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile