The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 09, 2015

Filed:

Jul. 12, 2007
Applicants:

Nelson Liang an Chang, San Jose, CA (US);

Niranjan Damera-venkata, Mountain View, CA (US);

Simon Widdowson, Dublin, CA (US);

Inventors:

Nelson Liang An Chang, San Jose, CA (US);

Niranjan Damera-Venkata, Mountain View, CA (US);

Simon Widdowson, Dublin, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03B 21/14 (2006.01); G03B 21/00 (2006.01); G06K 9/20 (2006.01); G06T 3/00 (2006.01); G06T 11/00 (2006.01); G06K 9/32 (2006.01);
U.S. Cl.
CPC ...
G03B 21/00 (2013.01); G06K 9/20 (2013.01); G06T 3/00 (2013.01); G06T 3/0056 (2013.01); G06T 11/006 (2013.01); G06T 11/001 (2013.01); G06T 3/005 (2013.01); G06K 2009/3291 (2013.01);
Abstract

A method performed by a display system is provided. The method includes projecting a first infrared pattern from a first projection plane of a first projector into a scene, capturing the first infrared pattern from the scene in a capture plane of at least one image capture device, and determining a first correspondence mapping between the first projector and the image capture device from at least the first infrared pattern in the first projection plane and the first infrared pattern in the capture plane.


Find Patent Forward Citations

Loading…