The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 09, 2015

Filed:

May. 04, 2012
Applicants:

Fei Chen, Lexington, KY (US);

Craig Eric Hadady, Cynthiana, KY (US);

Christopher Dane Jones, Georgetown, KY (US);

Simarpreet Singh Rattan, Lexington, KY (US);

Inventors:

Fei Chen, Lexington, KY (US);

Craig Eric Hadady, Cynthiana, KY (US);

Christopher Dane Jones, Georgetown, KY (US);

Simarpreet Singh Rattan, Lexington, KY (US);

Assignee:

Lexmark International, Inc., Lexington, KY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B41J 27/00 (2006.01); G03G 21/20 (2006.01); G02B 26/10 (2006.01); G03G 15/04 (2006.01);
U.S. Cl.
CPC ...
G02B 26/10 (2013.01); G03G 15/04072 (2013.01); G03G 2215/0145 (2013.01);
Abstract

A system and method for reducing scan line jitter caused by facet cut variation in scan systems employing a plurality of laser sources and a sensor for generating the timing for the laser sources. The system includes a controller for determining a unique time delay for each facet of the rotating mirror, and controlling the laser sources so that video provided by each laser source is delayed in a scan line by the unique time delay corresponding to the facet of the rotating mirror used in creating the scan line.


Find Patent Forward Citations

Loading…