The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 09, 2015

Filed:

Jan. 18, 2013
Applicant:

Olympus Corporation, Tokyo, JP;

Inventor:

Eiji Yokoi, Tokyo, JP;

Assignee:

OLYMPUS CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/06 (2006.01); G02B 21/08 (2006.01); G02B 21/16 (2006.01); G02B 21/36 (2006.01); G02B 27/58 (2006.01);
U.S. Cl.
CPC ...
G02B 21/06 (2013.01); G02B 21/082 (2013.01); G02B 21/16 (2013.01); G02B 21/367 (2013.01); G02B 27/58 (2013.01);
Abstract

A microscope system that performs structured illumination includes a light source configured to emit illumination light, an objective lens that irradiates a specimen with the illumination light, a phase-modulation spatial light modulator that has a two-dimensional pixel structure, that is arranged at the pupil conjugate position of the objective lens on an illumination light path between the light source and the objective lens, and that is configured to modulate a phase of the illumination light for each pixel so as to form a fringe illumination pattern on the specimen on the basis of an optical parameter of at least one of the light source and the objective lens.


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