The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 09, 2015
Filed:
Jun. 18, 2012
Sheng Fang, Houston, TX (US);
Zhiqiang Zhou, Houston, TX (US);
Paul G. Cairns, Houston, TX (US);
Baker Hughes Incorporated, Houston, TX (US);
Abstract
A method of processing azimuthal measurement data includes: receiving a plurality of data values generated by a rotating measurement tool, the measurement tool including at least one measurement sensor and configured to rotate and measure a signal at each of a plurality of azimuthal orientations; associating each received data value with an azimuthal orientation; selecting one or more data values that provide sufficient information regarding a measured signal, each of the selected data values having an associated azimuthal orientation; disregarding azimuthal orientations associated with one or more data values that provide insufficient information regarding a measured signal; and fitting only the selected data values to a sinusoidal curve.