The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 09, 2015

Filed:

May. 31, 2006
Applicant:

Steven R. Walton, Buckley, WA (US);

Inventor:

Steven R. Walton, Buckley, WA (US);

Assignee:

The Boeing Company, Chicago, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G01N 21/88 (2006.01); G06T 7/00 (2006.01); G01N 21/84 (2006.01);
U.S. Cl.
CPC ...
G01N 21/8806 (2013.01); G01N 2021/8472 (2013.01); G01N 2201/0626 (2013.01); G01N 2201/0627 (2013.01); G06T 7/0004 (2013.01); G06T 2207/10152 (2013.01); G06T 2207/30164 (2013.01);
Abstract

A system and method for inspecting a workpiece are provided. According to one embodiment, the system includes a plurality of illumination sources positioned proximate to the workpiece and each operable to generate at least one respective illumination beam to illuminate at least a portion of the workpiece, wherein each beam has a different respective color. The system also includes at least one camera positioned proximate to the workpiece and operable to capture at least one image of at least a portion of the workpiece including the illumination beams incident thereon. In addition, the system includes a data system capable of providing simultaneous two-dimensional and three-dimensional information indicative of the workpiece based on the image acquired by the camera.


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