The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 09, 2015

Filed:

Mar. 15, 2013
Applicant:

Chemimage Corporation, Pittsburgh, PA (US);

Inventors:

Patrick J. Treado, Pittsburgh, PA (US);

Matthew Nelson, Harrison City, PA (US);

Charles Gardner, Gibsonia, PA (US);

Assignee:

ChemImage Corporation, Pittsburgh, PA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/44 (2006.01); G01N 21/65 (2006.01); G01J 3/02 (2006.01); G01J 3/28 (2006.01); G01J 3/36 (2006.01); G01N 33/22 (2006.01); G01N 21/17 (2006.01);
U.S. Cl.
CPC ...
G01N 21/65 (2013.01); G01J 3/02 (2013.01); G01J 3/0264 (2013.01); G01J 3/2823 (2013.01); G01J 3/36 (2013.01); G01J 3/44 (2013.01); G01N 33/22 (2013.01); G01N 2021/1738 (2013.01); G01N 2021/174 (2013.01); G01N 2021/1744 (2013.01); G01J 3/0221 (2013.01); G01N 2201/0833 (2013.01); G01N 2201/0846 (2013.01);
Abstract

The present disclosure provides for a system and method for analyzing a sample comprising at least one unknown material. A first location may be scanned to generate a SWIR hyperspectral image. The SWIR hyperspectral image may be generated using dual polarization techniques. The SWIR hyperspectral image may be analyzed to target a second location comprising the unknown material. This second location may be further analyzed using Raman spectroscopic techniques and a Raman data set may be generated. The Raman data set may be further analyzed to associate the unknown material with a know material.


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