The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 09, 2015

Filed:

May. 31, 2012
Applicants:

Radislav Alexandrovich Potyrailo, Niskayuna, NY (US);

Matthew Damian Pietrzykowski, Clifton Park, NY (US);

Yongjae Lee, Niskayuna, NY (US);

Inventors:

Radislav Alexandrovich Potyrailo, Niskayuna, NY (US);

Matthew Damian Pietrzykowski, Clifton Park, NY (US);

Yongjae Lee, Niskayuna, NY (US);

Assignee:

General Electric Company, Niskayuna, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 27/28 (2006.01); G01N 27/02 (2006.01);
U.S. Cl.
CPC ...
G01N 27/028 (2013.01); G01N 27/026 (2013.01);
Abstract

A method is provided for selectively detecting the presence and concentration of at least four analytes in a mixture. In certain embodiments, the method comprises contacting a single sensor with the mixture of analytes, wherein the sensor comprises at least one resonant sensor circuit comprising a sensing material that comprises at least two material properties that change in the presence of four or more analytes in their mixtures, and generating a multivariate sensor response pattern. The methods disclosed herein further optionally comprise performing analyte classification and analyte quantitation. Methods for selectively detecting the concentration of at least one analyte in a mixture further comprising at least one interference are also described in the instant application.


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