The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 09, 2015

Filed:

Jul. 20, 2011
Applicants:

David Roberts Mcmurtry, Dursley, GB;

Stephen Paul Hunter, Chipping Sodbury, GB;

Inventors:

David Roberts McMurtry, Dursley, GB;

Stephen Paul Hunter, Chipping Sodbury, GB;

Assignee:

RENISHAW PLC, Wotton-Under-Edge, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 5/016 (2006.01); G01B 7/016 (2006.01); G01B 5/00 (2006.01); G01B 5/012 (2006.01); F16C 39/06 (2006.01);
U.S. Cl.
CPC ...
G01B 5/0016 (2013.01); G01B 5/016 (2013.01); G01B 7/016 (2013.01); G01B 5/012 (2013.01); F16C 39/063 (2013.01);
Abstract

Metrology apparatus is described that includes a first structure rotatably connected to a second structure by a bearing arrangement. The bearing arrangement includes at least a first friction bearing including parts in sliding contact during rotation of the first structure relative to the second structure. The apparatus includes at least one magnet that relieves the load on the first friction bearing. Multiple magnets, provided in an attracting or repelling arrangement, may be used. The metrology apparatus may include an articulating probe head for a coordinate positioning apparatus.


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