The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9052096 B1

PDF
Full Text
Expired
Date of Patent:
Jun. 09, 2015

Filed:

Apr. 25, 2012
Applicants:

Suzushi Nishimura, Tokyo, JP;

Soon Moon Jeong, Tokyo, JP;

Maki Fukuda, Tokyo, JP;

Toshihiko Shibanuma, Tokyo, JP;

Inventors:

Suzushi Nishimura, Tokyo, JP;

Soon Moon Jeong, Tokyo, JP;

Maki Fukuda, Tokyo, JP;

Toshihiko Shibanuma, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 51/52 (2006.01); F21V 13/10 (2006.01); B82Y 20/00 (2011.01);
U.S. Cl.
CPC ...
F21V 13/10 (2013.01); H01L 51/5275 (2013.01); B82Y 20/00 (2013.01); H01L 51/52 (2013.01); Y10S 977/834 (2013.01);
Abstract

A light extraction transparent substrate for an organic EL element includes a transparent supporting substrate; a diffraction grating having a first concavity and convexity layer having first concavities and convexities formed on a surface thereof, which is located on a surface of the transparent supporting substrate, and a microlens having a second concavity and convexity layer having second concavities and convexities formed on a surface thereof, which is located on a surface of the transparent supporting substrate. When a Fourier-transformed image is obtained by performing two-dimensional fast Fourier transform processing on a concavity and convexity analysis image obtained by analyzing the shape of each of the first and second concavities and convexities by use of an atomic force microscope, the Fourier-transformed image shows a circular or annular pattern substantially centered at an origin at which an absolute value of wavenumber is 0 μm.


Find Patent Forward Citations

Nishimura, Suzushi. (2015). Light extraction transparent substrate for organic el element, and organic el element using the same (U.S. Patent No. 9052096). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9052096

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