The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 09, 2015

Filed:

Oct. 03, 2011
Applicants:

Sheng Zhan, Houston, TX (US);

Izhar Ahmad, Spring, TX (US);

Inventors:

Sheng Zhan, Houston, TX (US);

Izhar Ahmad, Spring, TX (US);

Assignee:

Baker Hughes Incorporated, Houston, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 1/40 (2006.01); E21B 41/00 (2006.01); G01M 99/00 (2011.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
E21B 41/00 (2013.01); G01M 99/007 (2013.01); G01R 31/2817 (2013.01);
Abstract

A method and apparatus for estimating a time to failure of an electronic component used in a downhole environment is disclosed. A stress is applied to the electronic component to cause failure of a plurality of prognostic sensors associated with the electronic component, wherein the stress level at which a prognostic sensor fails is indicative of a stress level at which the electronic component fails. Failure times are obtained due to the applied stress for the plurality of prognostic sensors. A trend is determined from the obtained failure times of the prognostic sensors. The time of failure of the electronic component is estimated from the determined trend.


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