The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 09, 2015
Filed:
Oct. 27, 2010
Method for dynamically analyzing distribution variation of scatterers and application using the same
Applicants:
Meng-lin LI, Hsinchu, TW;
Hao-li Liu, Hsinchu, TW;
Da-wei LI, Hsinchu, TW;
Inventors:
Assignee:
National Tsing Hua University, Hsinchu, TW;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 8/00 (2006.01); A61B 8/08 (2006.01); A61N 7/02 (2006.01); A61B 19/00 (2006.01);
U.S. Cl.
CPC ...
A61B 8/08 (2013.01); A61B 2019/5276 (2013.01); A61N 7/02 (2013.01);
Abstract
A method for dynamically analyzing distribution variation of scatterers is provided and used for dynamically analyzing changes in two or three dimensional scatterer distribution and concentration of ultrasound data by using probability density function along with a moving window technique. The present invention has advantages in low computation load and may be used for real-time analysis. A method for dynamically detecting thermal ablation area and thermal ablation level and a method for dynamically controlling thermal ablation intensity are also provided for non-invasive detection and thermal ablation.