The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 2015
Filed:
Dec. 31, 2012
Electronics and Telecommunications Research Institute, Daejeon, KR;
Jae-Bok Park, Daejeon, KR;
Duk-Kyun Woo, Daejeon, KR;
ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE, Daejeon, KR;
Abstract
Disclosed herein are a location measurement method and apparatus. The apparatus includes a first grading unit, a first presumed line calculation unit, a second grading unit, a second presumed lined calculating unit, a presumed location calculation unit, and a final location calculation unit. The first grading unit determines the grade of a first RSSI. The first presumed line calculation unit calculates the range of the object from a first node based on the grade of the first RSSI. The second grading unit determines the grade of a second RSSI. The second presumed line calculating unit calculates the range of the object from a second node based on the grade of the second RSSI. The presumed location calculation unit calculates two presumed locations. The final location calculation unit determines one of the two presumed locations to be the final location of the object.