The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 02, 2015

Filed:

Apr. 10, 2012
Applicants:

Juan Liu, Miliptas, CA (US);

Robert Price, Palo Alto, CA (US);

Eric S. Hamby, Webster, NY (US);

Rajinderjeet S. Minhas, Churchville, NY (US);

Inventors:

Juan Liu, Miliptas, CA (US);

Robert Price, Palo Alto, CA (US);

Eric S. Hamby, Webster, NY (US);

Rajinderjeet S. Minhas, Churchville, NY (US);

Assignees:

Palo Alto Research Center Incorporated, Palo Alto, CA (US);

Xerox Corporation, Norwalk, CT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 5/00 (2006.01); H04N 1/00 (2006.01); H04N 1/60 (2006.01);
U.S. Cl.
CPC ...
H04N 1/00029 (2013.01); H04N 1/00005 (2013.01); H04N 1/00015 (2013.01); H04N 1/00031 (2013.01); H04N 1/00045 (2013.01); H04N 1/00058 (2013.01); H04N 1/6038 (2013.01);
Abstract

The presently disclosed embodiment provides an interactive tool for printed image artifact characterization that successfully combines the advantages from both a human visual system and automated image quality characterization. In the interactive tool provided, the user may specify coarse level information, such as the region of interest in a print image, to be examined by the automated image-quality characterization algorithm, which can then employ sophisticated algorithms, e.g. signal processing, feature extraction, estimation and classification, to find precise fine-level descriptors.


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