The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 02, 2015

Filed:

Feb. 10, 2015
Applicant:

Iq-analog Corporation, San Diego, CA (US);

Inventor:

Nitin Nidhi, San Diego, CA (US);

Assignee:

IQ-Analog Corporation, San Diego, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/10 (2006.01); H03M 1/60 (2006.01); H03M 1/64 (2006.01);
U.S. Cl.
CPC ...
H03M 1/1009 (2013.01); H03M 1/60 (2013.01); H03M 1/64 (2013.01);
Abstract

A method is provided for calibrating the mean frequency of a voltage controlled oscillator (VCO) based analog-to-digital converter (ADC). The method accepts a differential analog input signal comprising a positive signal and a negative signal. The positive signal is converted into a first frequency and the negative signal is converted into a second frequency. The first frequency is converted into a first digital value and the second frequency is converted into a second digital value. The first digital value is added to the second digital value to find a common mode value, and the common mode value is compared to a predetermined common mode value to find a first error. The first error is converted to a first bias modification of the differential analog input signal, and in response to the differential analog input first bias modification, the first error is minimized.


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