The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 02, 2015

Filed:

Feb. 22, 2013
Applicant:

Stec, Inc., Santa Ana, CA (US);

Inventors:

Aldo G. Cometti, San Diego, CA (US);

Pablo Alejandro Ziperovich, San Diego, CA (US);

Assignee:

STEC, Inc., Santa Ana, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/04 (2006.01); G11C 16/06 (2006.01); G11C 16/10 (2006.01); G11C 16/26 (2006.01); G11C 16/34 (2006.01); G11C 11/56 (2006.01);
U.S. Cl.
CPC ...
G11C 16/06 (2013.01); G11C 16/3418 (2013.01); G11C 16/0483 (2013.01); G11C 11/5628 (2013.01); G11C 11/5642 (2013.01); G11C 16/10 (2013.01); G11C 16/26 (2013.01);
Abstract

Disclosed is an apparatus and method for adjusting operating parameters in a storage device. A controller in a solid state drive monitors current operating conditions for blocks of memory used to store data in the drive. When a block has been subjected to a predetermined number of program/erase cycles one or more stored bias values are retrieved from a storage location based on the wordline(s) associated with a current memory operation. The one or more parameters of the memory operation are then adjusted based on the one or more stored bias values, and the memory operation performed on the block of memory cells using the adjusted parameters.


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