The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 2015
Filed:
Feb. 28, 2013
Siemens Aktiengesellschaft, Munich, DE;
Martin Petersilka, Adelsdorf, DE;
Karl Stierstorfer, Erlangen, DE;
SIEMENS AKTIENGESELLSCHAFT, Munich, DE;
Abstract
A method is disclosed for reconstructing image data of an examination object from measurement data, wherein the measurement data were acquired in the course of a relative rotational movement between a radiation source of a computed tomography system and the examination object. First image data of the examination object are reconstructed from the measurement data. Scatter signals are calculated from the first image data using a scattered radiation model, wherein the scattered radiation model specifies an angle-dependent scatter distribution for a scatter point as a function of a line integral corresponding to an attenuation integral of a scattered beam from the scatter point to a specific detector element. The calculated scatter signals are used for correcting the measurement data, and second image data are reconstructed using the corrected measurement data.