The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 02, 2015

Filed:

Oct. 03, 2012
Applicants:

Isaac Wen-yih Tseng, Taipei, TW;

Yung-chin Hsu, Taipei, TW;

Inventors:

Isaac Wen-Yih Tseng, Taipei, TW;

Yung-Chin Hsu, Taipei, TW;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 11/00 (2006.01); G06T 7/00 (2006.01);
U.S. Cl.
CPC ...
G06T 11/003 (2013.01); G06T 7/0014 (2013.01); G06T 7/003 (2013.01); G06T 7/0044 (2013.01); G06T 2207/10088 (2013.01); G06T 2207/20076 (2013.01); G06T 2207/30016 (2013.01);
Abstract

A transformation method for diffusion spectrum imaging includes: receiving an original DSI dataset and a template DSI dataset; computing an energy function; computing, for each time point, first-order and second-order derivatives of the energy function with respect to velocity fields in an image space and in a q-space; computing, for each time point, the velocity fields in the image space and in the q-space based upon the first-order and second-order derivatives; performing integration on the velocity fields over time to obtain a deformation field; and generating a transformed DSI dataset according to the deformation field.


Find Patent Forward Citations

Tseng, Isaac Wen-Yih. (2015). Transformation method for diffusion spectrum imaging using large deformation diffeomorphic metric mapping (U.S. Patent No. 9047695). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9047695

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…