The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 2015
Filed:
Apr. 30, 2013
Gii Acquisition, Llc, Davisburg, MI (US);
Michael G. Nygaard, Fenton, MI (US);
GII ACQUISITION, LCC, Davisburg, MI (US);
Abstract
A method and system for optically inspecting the entire outer peripheral surface of a part are provided. The system includes an enclosure which allows movement of a part relative to the enclosure both prior to and after inspection within the enclosure. An illumination assembly simultaneously illuminates a plurality of exterior side surfaces of the part which are annularly spaced about the axis of the part with radiation when the part is at a predetermined location within the enclosure to obtain corresponding reflected radiation signals. A plurality of lens and detector assemblies are provided. Each of the assemblies forms an optical image of one of the illuminated exterior side surfaces from the reflected radiation signals and detects the formed optical image within the enclosure. A processor processes the detected optical images to obtain a continuous, seamless, 360° panoramic composite image of the peripheral surface of the part.