The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 2015
Filed:
Dec. 02, 2010
Koji Okabe, Tokyo, JP;
Ken Hanazawa, Tokyo, JP;
Seiya Osada, Tokyo, JP;
Takayuki Arakawa, Tokyo, JP;
Daisuke Tanaka, Tokyo, JP;
Koji Okabe, Tokyo, JP;
Ken Hanazawa, Tokyo, JP;
Seiya Osada, Tokyo, JP;
Takayuki Arakawa, Tokyo, JP;
Daisuke Tanaka, Tokyo, JP;
NEC CORPORATION, Tokyo, JP;
Abstract
A plurality of pruning measures (PM) are calculated from a feature amount (CV) of test data (TD) which is input, a plurality of isopycnic surfaces (EC) are plotted and set on a threshold space (SS), a threshold curved surface (SC) in which a decrease in at least one of a plurality of pruning measures (PM) causes an increase in at least one thereof is generated using a portion of one isopycnic surface (EC) as a part, a hypothesis curved surface (HC) of subject data (CD) is generated on the threshold space (SS) to set a position intersecting the threshold curved surface (SC) to a pruning threshold (PS), and a plurality of hypotheses of the subject data (CD) are pruned. Thereby, there is provided a data processing device of which at least one of the recognition speed and the recognition accuracy is higher than in the related art.