The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 2015
Filed:
Jul. 16, 2013
Infosys Limited, Bangalore, IN;
Krishna Markande, Bangalore, IN;
Sridhar Murthy Jayaram, Bangalore, IN;
Infosys Limited, Bangalore, IN;
Abstract
Cloud-based testing of applications allows an application under test (AUT) to be subjected to test loads mimicking expected high volume real-time production loads. Test loads can be applied from geographically distributed test load sources. During testing, the system can monitor usage of AUTs and the underlying cloud infrastructure (virtual machines, test servers, etc.) on which the AUT is executing. An AUT can be scaled, for instance, additional instances of the application can be started, and additional virtual machines can be configured and test servers provisioned if AUT or infrastructure usage exceeds specified thresholds during testing. A testing services provider can supply a web-based unified management console from which admins and test users can manage AUT testing.