The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 2015
Filed:
May. 09, 2011
Byoung Ju Choi, Seoul, KR;
Joo Young Seo, Seoul, KR;
Sueng Wan Yang, Gunpo, KR;
Young Su Kim, Yongin Gyeonggi-Do, KR;
Jung Suk OH, Gwangmyeong, KR;
Hae Young Kwon, Yongin, KR;
Seung Yeun Jang, Goyang, KR;
Byoung Ju Choi, Seoul, KR;
Joo Young Seo, Seoul, KR;
Sueng Wan Yang, Gunpo, KR;
Young Su Kim, Yongin Gyeonggi-Do, KR;
Jung Suk Oh, Gwangmyeong, KR;
Hae Young Kwon, Yongin, KR;
Seung Yeun Jang, Goyang, KR;
Hyundai Motor Company, Seoul, KR;
Kia Motors Corporation, Seoul, KR;
Abstract
The present invention relates to an exception handling test apparatus and method. The exception handling test apparatus includes a generation module configured to generate a modified device driver based on a defect model and information obtained from the device manager, a hooking module configured to hook the device driver using the modified device driver, a scanning module configured to collect test information returned from the hooked modified device driver to the application while the application operates, and an analysis module configured to analyze the collected test information.