The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9047397 B1

PDF
Full Text
Expired
Date of Patent:
Jun. 02, 2015

Filed:

Sep. 28, 2012
Applicant:

Los Alamos National Security, Llc, Los Alamos, NM (US);

Inventors:

Brian A. Temple, Los Alamos, NM (US);

Jerawan C. Armstrong, Los Alamos, NM (US);

Kevin L. Buescher, White Rock, NM (US);

Jeffrey A. Favorite, Los Alamos, NM (US);

Assignee:

Los Alamos National Security, LLC, Los Alamos, NM (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06F 19/00 (2011.01);
U.S. Cl.
CPC ...
G06F 19/345 (2013.01);
Abstract

Disclosed herein are representative embodiments of methods, apparatus, and systems for performing radiography analysis. For example, certain embodiments perform radiographic analysis using mixed variable computation techniques. One exemplary system comprises a radiation source, a two-dimensional detector for detecting radiation transmitted through a object between the radiation source and detector, and a computer. In this embodiment, the computer is configured to input the radiographic image data from the two-dimensional detector and to determine one or more materials that form the object by using an iterative analysis technique that selects the one or more materials from hierarchically arranged solution spaces of discrete material possibilities and selects the layer interfaces from the optimization of the continuous interface data.


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