The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 02, 2015

Filed:

Oct. 17, 2005
Applicants:

Karen W. Brannon, Palo Alto, CA (US);

Ying Chen, San Jose, CA (US);

Inventors:

Karen W. Brannon, Palo Alto, CA (US);

Ying Chen, San Jose, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/3051 (2013.01); G06F 17/30371 (2013.01); G06F 17/30368 (2013.01);
Abstract

Fast restoration of referential integrity between metadata and data after they were restored to some inconsistent backup copies in content management archival solutions. An inferred logging mechanism uses separate metadata and data logs to capture recent update activities during normal system conditions with additional object reference information using a method called reference tagging. This requires no system internal changes and introduces no performance overhead. The information in the logs facilitates quick identification of potential referential inconsistencies and allows referential integrity between metadata and data to be restored in a fraction of the time when compared to exhaustive data scans.


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