The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 2015
Filed:
Sep. 11, 2007
Sandeep Jain, Palo Alto, CA (US);
David Knight, Belmont, CA (US);
Sandeep Jain, Palo Alto, CA (US);
David Knight, Belmont, CA (US);
OPSHUB, INC., , CA (US);
Abstract
Techniques are provided for tracking and analyzing defect density by source file or module. Defect density is the number of distinct defects which required changes to be made (to fix the defect) to a particular file or module in a given period of time. This metric is very useful for identifying the most critical areas of weakness of the system and hence the areas where additional investment/action may be taken. For example, this metric can be used to prioritize the area in which unit tests should be written, for which additional automated system tests should be written or which a project should be undertaken to re-write the error prone file or module to improve its quality and maintainability.