The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 02, 2015

Filed:

Mar. 19, 2008
Applicants:

Hyoung Bae Lee, Incheon, KR;

Yong Chul OH, Hwaseoung-si, KR;

Inventors:

Hyoung Bae Lee, Incheon, KR;

Yong Chul Oh, Hwaseoung-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B05C 13/00 (2006.01); B23Q 3/08 (2006.01); G02F 1/1339 (2006.01);
U.S. Cl.
CPC ...
G02F 1/1339 (2013.01); B05C 13/00 (2013.01);
Abstract

Disclosed are a substrate support apparatus and an apparatus for examining the seal pattern of an LCD cell. The substrate support apparatus includes a movable stage provided with drawing nozzles for attaching a substrate to an upper surface and adapted to rotate by a predetermined angle; a fixed stage spaced from the movable stage and provided with floating nozzles for ejecting air upward and drawing nozzles for drawing air downward; and a driving device coupled to the movable stage to rotate the movable stage. The apparatus for examining the seal pattern of an LCD cell includes the substrate support apparatus; and a gantry unit including support platforms positioned on both sides of the substrate support apparatus, a bridge positioned above the substrate support apparatus to connect the support platforms, and a correction device coupled to the bridge to examine and repair a seal pattern of a substrate.


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