The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 2015
Filed:
Oct. 03, 2012
Hideo Uemura, Toyokawa, JP;
Makoto Ooki, Toyohashi, JP;
Wataru Senoo, Toyokawa, JP;
KONICA MINOLTA BUSINESS TECHNOLOGIES, INC., Chiyoda-Ku, Tokyo, JP;
Abstract
In an oblique-incidence optical system, a pair of optical beams are incident from the deflection section on an optically anisotropic common scanning lens. First and second individual scanning lenses are optically anisotropic and on which the one and the other of the pair of optical beams are respectively incident from the common scanning lens. Light sources are arranged such that their respective planes of polarization are symmetrical to each other. The first and second individual scanning lenses are arranged so as to be symmetrical to each other, the common scanning lens has a symmetrical shape in the secondary direction with respect to a plane including its own optical axis, and each of the individual scanning lenses has an asymmetrical shape in the secondary direction with respect to a plane including its own optical axis.