The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 2015
Filed:
Mar. 06, 2009
Applicants:
Xiquan Cui, Pasadena, CA (US);
Changhuei Yang, Pasadena, CA (US);
Inventors:
Xiquan Cui, Pasadena, CA (US);
Changhuei Yang, Pasadena, CA (US);
Assignee:
California Institute of Technology, Pasadena, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/06 (2006.01); G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
G02B 21/0024 (2013.01); G02B 21/06 (2013.01); G02B 21/0032 (2013.01);
Abstract
A microscopy method and configuration provides the ability to achieve wide field view and high resolution simultaneously. A beam array generator generates an M×N light beam array that illuminates a sample and an M×N sensor array. The sensor array obtains a whole microscopy image of the sample based on the light beam array. Each light beam of the array corresponds to one unique pixel sensor in the sensor array. A scanning of all light beams of the light beam array covers a whole area of the sample.