The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 2015
Filed:
Dec. 21, 2012
Olympus Corporation, Shibuya-ku, Tokyo, JP;
Yosuke Tamura, Kawaguchi, JP;
OLYMPUS CORPORATION, Tokyo, JP;
Abstract
A microscope system and an autofocus method capture a subject at a specified time interval through an optical image forming system while relatively moving a stage loaded with the subject and the optical image forming system of the microscope; calculate a contrast value indicating a high and low contrast of a captured observation image; detect a maximum contrast image whose calculated contrast value is maximum in a plurality of performed observation images; detect the relative position of the stage and the optical image forming system; perform a correcting process of moving the detected relative position corresponding to the detected maximum contrast image by a specified value in a direction opposite the direction of the relative movement; and bring focus using the corrected relative position as a focal point.