The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 2015
Filed:
Nov. 28, 2012
Applicant:
Advanced Micro Devices, Inc., Sunnyvale, CA (US);
Inventors:
Grady L. Giles, Dripping Springs, TX (US);
James A. Wingfield, Austin, TX (US);
Atchyuth K. Gorti, Austin, TX (US);
Assignee:
ADVANCED MICRO DEVICES, INC, Sunnyvale, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 31/3185 (2006.01);
U.S. Cl.
CPC ...
G01R 31/318544 (2013.01); G01R 31/318555 (2013.01);
Abstract
A test circuit for a functional circuit includes a scan chain coupled to the functional circuit, and a controller coupled to the scan chain, for controlling the scan chain to scan a test pattern into the scan chain, and subsequently and repetitively for a multiple number of times launch the test pattern to the functional circuit, capture test data into the scan chain, and restore the test pattern in the scan chain for subsequent launch.