The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 2015
Filed:
Aug. 30, 2010
Applicants:
Felix Beyeler, Regensdorf, CH;
Simon Muntwyler, Zurich, CH;
Inventors:
Felix Beyeler, Regensdorf, CH;
Simon Muntwyler, Zurich, CH;
Assignee:
Femtotools AG, Buchs Zh, CH;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01L 1/00 (2006.01); G01L 1/10 (2006.01); G01Q 30/02 (2010.01); B81C 99/00 (2010.01); B82Y 35/00 (2011.01); G01B 9/04 (2006.01); G02B 21/32 (2006.01);
U.S. Cl.
CPC ...
G01Q 30/025 (2013.01); B81C 99/003 (2013.01); B82Y 35/00 (2013.01); G01B 9/04 (2013.01); G01N 2203/0089 (2013.01); G01N 2203/0286 (2013.01); G02B 21/32 (2013.01);
Abstract
The mechanical characterization system includes three main parts: A sub-millinewton resolution capacitive force sensor, at least one micromanipulator with position measurement capabilities, and a microscope. The sensitive axis of the force sensor is adjustably connected via adaptor pieces to the micromanipulator at any angular orientation relative to the sample holder.