The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 2015
Filed:
Feb. 10, 2012
Ya-hui Tsai, Pingjhen, TW;
Kuo-tang Huang, Pingjhen, TW;
Chin-kuei Chang, New Taipei, TW;
Chun-lung Chang, Zhubei, TW;
Ya-Hui Tsai, Pingjhen, TW;
Kuo-Tang Huang, Pingjhen, TW;
Chin-Kuei Chang, New Taipei, TW;
Chun-Lung Chang, Zhubei, TW;
Industrial Technology Research Institute, Hsinchu, TW;
Abstract
A capturing method for a plurality of images with different view-angles and a capturing system using the same are provided. The capturing method for the images with different view-angles includes the following steps. An appearance image of an object is captured by an image capturing unit at a capturing angle. A light reflection area of the appearance image is detected by a detecting unit, and a dimension characteristic of the light reflection area is analyzed by the same. Whether the dimension characteristic of the light reflection area is larger than a first predetermined value is determined. If the dimension characteristic of the light reflection area is larger than the first predetermined value, then the capturing angle is adjusted within a first adjusting range. After the step of adjusting the capturing angle within a first adjusting range is performed, the step of capturing the appearance image is performed again.