The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 2015
Filed:
Aug. 31, 2011
Naoyuki Kono, Mito, JP;
Atsushi Baba, Tokai, JP;
Yoshinori Musha, Hitachiohta, JP;
Mitsubishi Hitachi Power Systems, Ltd., Kanagawa, JP;
Abstract
An ultrasonic testing method is provided to measure a thickness of an object in a simple and highly accurate manner when crystal grains that form a metal solidification structure of a directionally-solidified material cast or the like have a statistical variation. An ultrasonic probecauses a longitudinal ultrasonic wave to be incident on a test objectin a direction perpendicular to a surfaceA of the test object. As a velocity of the longitudinal ultrasonic wave, the average of velocities of longitudinal ultrasonic waves propagating in directions of crystal orientations <100>, <110>, and <210> is used. The thickness of the test objectis measured on the basis of the velocity of the ultrasonic wave and a time period for the propagation of the ultrasonic wave.