The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 02, 2015

Filed:

Apr. 21, 2006
Applicants:

Stuart B. Adler, Seattle, WA (US);

Jamie R. Wilson, Seattle, WA (US);

Shawn L. Huff, Seattle, WA (US);

Daniel T. Schwartz, Seattle, WA (US);

Inventors:

Stuart B. Adler, Seattle, WA (US);

Jamie R. Wilson, Seattle, WA (US);

Shawn L. Huff, Seattle, WA (US);

Daniel T. Schwartz, Seattle, WA (US);

Assignee:

University of Washington, Seattle, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/02 (2006.01);
U.S. Cl.
CPC ...
G01N 27/02 (2013.01); G01N 27/021 (2013.01); G01N 27/028 (2013.01);
Abstract

A method for conducting nonlinear electrochemical impedance spectroscopy. The method includes quantifying the nonlinear response of an electrochemical system by measuring higher-order current or voltage harmonics generated by moderate-amplitude sinusoidal current or voltage perturbations. The method involves acquisition of the response signal followed by time apodization and fast Fourier transformation of the data into the frequency domain, where the magnitude and phase of each harmonic signal can be readily quantified. The method can be implemented on a computer as a software program.


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