The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 2015
Filed:
Apr. 20, 2012
Applicant:
Michael W. Kudenov, Tucson, AZ (US);
Inventor:
Michael W. Kudenov, Tucson, AZ (US);
Assignee:
The Arizona Board of Regents on Behalf of the University of Arizona, Tucson, AZ (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/45 (2006.01); G01J 3/453 (2006.01); G01J 3/28 (2006.01); G01J 3/02 (2006.01); G01J 3/447 (2006.01);
U.S. Cl.
CPC ...
G01J 3/4531 (2013.01); G01J 3/2803 (2013.01); G01J 3/0208 (2013.01); G01J 3/0229 (2013.01); G01J 2003/452 (2013.01); G01J 3/447 (2013.01);
Abstract
Snapshot imaging Fourier transform spectrometers include a lens array that produces sub-images that are directed through a birefringent interferometer in orthogonal polarization eigenstates that acquire an optical path difference. Interference patterns based on this OPD can be Fourier transformed to obtain a spectral image. In some examples, polarizing gratings provide a spatial heterodyne frequency and offset the spectra.