The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 2015
Filed:
Feb. 25, 2013
Applicant:
The United States of America As Represented BY the Administrator of the National Aeronautics and Space Administration, Washington, DC (US);
Inventors:
Sang Hyouk Choi, Poquoson, VA (US);
Yeonjoon Park, Yorktown, VA (US);
Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/28 (2006.01); G01J 3/18 (2006.01); G02B 5/18 (2006.01);
U.S. Cl.
CPC ...
G01J 3/18 (2013.01); G02B 5/1842 (2013.01); G02B 5/1876 (2013.01);
Abstract
A spectrometer that includes a grating that disperses light via Fresnel diffraction according to wavelength onto a sensing area that coincides with an optical axis plane of the grating. The sensing area detects the dispersed light and measures the light intensity associated with each wavelength of the light. Because the spectrometer utilizes Fresnel diffraction, it can be miniaturized and packaged as an integrated circuit.