The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 2015
Filed:
Nov. 11, 2013
Weatherford/lamb, Inc., Houston, TX (US);
Domino Taverner, Delray Beach, FL (US);
Zhuang Wang, Wallingford, CT (US);
WEATHERFORD/LAMB, INC., Houston, TX (US);
Abstract
Methods and apparatus for accurately determining wavelength by compensating a time delay using a bidirectional wavelength scan are provided. One example method generally includes introducing first wavelength-swept light into an optical waveguide according to a first sweep function having a first wavelength sweep direction; interrogating one or more optical elements, having characteristic wavelengths, with the first wavelength-swept light to produce a first set of optical signals, wherein the optical elements are disposed along the optical waveguide; introducing second wavelength-swept light into the optical waveguide according to a second sweep function having a second wavelength sweep direction, wherein the second wavelength sweep direction is opposite the first wavelength sweep direction; interrogating the optical elements with the second wavelength-swept light to produce a second set of optical signals; and determining a parameter associated with at least one of the optical elements based on the first and second sets of optical signals.